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1

[Frontiers in Electronic Testing] Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation Volume 23 || Soft Errors on Digital Components

Benso, Alfredo, Prinetto, Paolo

Year:

2004

Language:

english

File:

PDF, 194 KB

english, 2004

2

[IEEE Technology of Integrated Systems in Nanoscal Era (DTIS) - Cairo, Egypt (2009.04.6-2009.04.9)] 2009 4th International Conference on Design & Technology of Integrated Systems in Nanoscal Era - TLM 2.0 simple sockets synthesis to RTL

Hatami, Nadereh, Ghofrani, Amirali, Prinetto, Paolo, Navabi, Zainalabedin

Year:

2009

Language:

english

File:

PDF, 1.32 MB

english, 2009

3

Design and Review of Water Management System Using Ethernet, Wi-Fi 802.11n, Modbus, and Other Communication Standards

Pandey, Bishwajeet, Farulla, Giuseppe Airo, Indaco, Marco, Iovino, Ludovico, Prinetto, Paolo

Journal:

Wireless Personal Communications

Year:

2018

Language:

english

File:

PDF, 2.23 MB

english, 2018

4

[IEEE 2013 18th IEEE European Test Symposium (ETS) - Avignon, France (2013.05.27-2013.05.30)] 2013 18TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - A software-based self test of CUDA Fermi GPUs

Di Carlo, Stefano, Gambardella, Giulio, Indaco, Marco, Martella, Ippazio, Prinetto, Paolo, Rolfo, Daniele, Trotta, Pascal

Year:

2013

Language:

english

File:

PDF, 456 KB

english, 2013

5

Automatic and Simultaneous Floorplanning and Placement in Field-Programmable Gate Arrays With Dynamic Partial Reconfiguration Based on Genetic Algorithm

Sadeghi, Ali, Zolfy Lighvan, Mina, Prinetto, Paolo

Journal:

Canadian Journal of Electrical and Computer Engineering

Year:

2020

File:

PDF, 4.08 MB

2020

6

Integrating online and offline testing of a switching memory

Barbagallo, S., Medina, D., Corno, F., Prinetto, P., Reorda, M.S.

Journal:

IEEE Design & Test of Computers

Year:

1998

Language:

english

File:

PDF, 127 KB

english, 1998

7

System-level functional testing from UML specifications in end-of-production industrial environments

Andrea Baldini, Alfredo Benso, Paolo Prinetto

Journal:

International Journal on Software Tools for Technology Transfer (STTT)

Year:

2005

Language:

english

File:

PDF, 1.08 MB

english, 2005

8

[IEEE 2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT) - Roma, Italy (2020.6.3-2020.6.5)] 2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT - Tactile sensing with gesture-controlled collaborative robot

Sorgini, Francesca, Farulla, Giuseppe Airo, Lukic, Nikola, Danilov, Ivan, Roveda, Loris, Milivojevic, Milos, Pulikottil, Terrin Babu, Carrozza, Maria Chiara, Prinetto, Paolo, Tolio, Tullio, Oddo, Calo

Year:

2020

File:

PDF, 4.37 MB

2020

9

[IEEE 2013 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2013.09.6-2013.09.13)] 2013 IEEE International Test Conference (ITC) - Fault mitigation strategies for CUDA GPUs

Di Carlo, Stefano, Gambardella, Giulio, Martella, Ippazio, Prinetto, Paolo, Rolfo, Daniele, Trotta, Pascal

Year:

2013

Language:

english

File:

PDF, 2.41 MB

english, 2013

10

[IEEE 2020 IEEE East-West Design & Test Symposium (EWDTS) - Varna, Bulgaria (2020.9.4-2020.9.7)] 2020 IEEE East-West Design & Test Symposium (EWDTS) - Hardware-based Capture-The-Flag Challenges

PRINETTO, Paolo, ROASCIO, Gianluca, VARRIALE, Antonio

Year:

2020

File:

PDF, 162 KB

2020

11

Investigation of Acid−Base Properties of Catalysts Obtained from Layered Double Hydroxides

Prinetto, Federica, Ghiotti, Giovanna, Durand, Robert, Tichit, Didier

Journal:

Journal of Physical Chemistry B

Year:

2000

Language:

english

File:

PDF, 119 KB

english, 2000

12

Characterization of materials for gas sensors. Surface chemistry of SnO2 and MoOx–SnO2 nano-sized powders and electrical responses of the related thick films

A Chiorino, G Ghiotti, F Prinetto, M.C Carotta, M Gallana, G Martinelli

Journal:

Sensors and Actuators B: Chemical

Year:

1999

Language:

english

File:

PDF, 302 KB

english, 1999

13

A High-Level EDA Environment for the Automatic Insertion of HD-BIST Structures

Alfredo Benso, Silvia Cataldo, Silvia Chiusano, Paolo Prinetto, Yervant Zorian

Journal:

Journal of Electronic Testing

Year:

2000

Language:

english

File:

PDF, 219 KB

english, 2000

14

[IEEE 2009 First International Conference on Advances in System Testing and Validation Lifecycle (VALID) - Porto, Portugal (2009.09.20-2009.09.25)] 2009 First International Conference on Advances in System Testing and Validation Lifecycle - A Low-Cost FPGA-Based Test and Diagnosis Architecture for SRAMs

Carlo, Stefano Di, Prinetto, Paolo, Scionti, Alberto, Figueras, Joan, Manich, Salvador, Rodriguez-Montanes, Rosa

Year:

2009

Language:

english

File:

PDF, 394 KB

english, 2009

15

Knowledge-based systems as an aid to computer-aided repair

Paolo Camurati, Marco Mezzalama, Paolo Prinetto

Journal:

Microprocessors and Microsystems

Year:

1989

Language:

english

File:

PDF, 725 KB

english, 1989

16

Online self-repair of fir filters

Benso, A., Di Carlo, S., Di Natale, G., Prinetto, P.

Journal:

IEEE Design & Test of Computers

Year:

2003

Language:

english

File:

PDF, 365 KB

english, 2003

17

[IEEE Comput. Soc. Press 14th VLSI Test Symposium - Princeton, NJ, USA (28 April-1 May 1996)] Proceedings of 14th VLSI Test Symposium - Scan insertion criteria for low design impact

Barbagallo, S., Lobetti Bodoni, M., Medina, D., Corno, F., Prinetto, P., Sonza Reorda, M.

Year:

1996

Language:

english

File:

PDF, 555 KB

english, 1996

18

Design and optimization of adaptable BCH codecs for NAND flash memories

Fabiano, M., Indaco, M., Di Carlo, S., Prinetto, P.

Journal:

Microprocessors and Microsystems

Year:

2013

Language:

english

File:

PDF, 2.05 MB

english, 2013

19

Testing embedded memories in telecommunication systems

Barbagallo, S., Lobetti Bodoni, M., Benso, A., Chiusano, S., Prinetto, P.

Journal:

IEEE Communications Magazine

Year:

1999

Language:

english

File:

PDF, 1.39 MB

english, 1999

20

Online and offline BIST in IP-core design

Benso, A., Chinsano, S., Di Natale, G., Prinetto, P., Bodoni, M.L.

Journal:

IEEE Design & Test of Computers

Year:

2001

Language:

english

File:

PDF, 150 KB

english, 2001

21

[IEEE 2014 17th Euromicro Conference on Digital System Design (DSD) - Verona, Italy (2014.8.27-2014.8.29)] 2014 17th Euromicro Conference on Digital System Design - On Enhancing Fault Injection's Capabilities and Performances for Safety Critical Systems

Carlo, Stefano Di, Gambardella, Giulio, Prinetto, Paolo, Reichenbach, Frank, Lokstad, Trond, Rafiq, Gulzaib

Year:

2014

Language:

english

File:

PDF, 587 KB

english, 2014

22

[IEEE Test Symposium (EWDTS) - St. Petersburg, Russia (2010.09.17-2010.09.20)] 2010 East-West Design & Test Symposium (EWDTS) - Exploring modeling and testing of NAND flash memories

Di Carlo, Stefano, Fabiano, Michele, Piazza, Roberto, Prinetto, Paolo

Year:

2010

Language:

english

File:

PDF, 689 KB

english, 2010

23

[IEEE 2017 22nd IEEE European Test Symposium (ETS) - Limassol, Cyprus (2017.5.22-2017.5.26)] 2017 22nd IEEE European Test Symposium (ETS) - Scan chain encryption for the test, diagnosis and debug of secure circuits

Da Silva, Mathieu, Flottes, Marie-lise, Di Natale, Giorgio, Rouzeyre, Bruno, Prinetto, Paolo, Restifo, Marco

Year:

2017

Language:

english

File:

PDF, 647 KB

english, 2017

24

[IEEE Test Symposium (EWDTS) - St. Petersburg, Russia (2010.09.17-2010.09.20)] 2010 East-West Design & Test Symposium (EWDTS) - Communication interface synthesis from TLM 2.0 to RTL

Hatami, Nadereh, Indaco, Marco, Prinetto, Paolo, Tiotto, Gabrielle

Year:

2010

Language:

english

File:

PDF, 385 KB

english, 2010

25

[Frontiers in Electronic Testing] Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation Volume 23 || VHDL Simulation-Based Fault Injection Techniques

Benso, Alfredo, Prinetto, Paolo

Year:

2004

Language:

english

File:

PDF, 1.02 MB

english, 2004

26

Chemical and electronic characterization of pure SnO2 and Cr-doped SnO2 pellets through their different response to NO

Giovanna Ghiotti, Anna Chiorino, Federica Prinetto

Journal:

Sensors and Actuators B: Chemical

Year:

1995

Language:

english

File:

PDF, 391 KB

english, 1995

27

A hierarchical infrastructure for soc test management

Benso, A., Di Carlo, S., Prinetto, P., Zorian, Y.

Journal:

IEEE Design & Test of Computers

Year:

2003

Language:

english

File:

PDF, 548 KB

english, 2003

28

Infrared characterization of MoOx/ZrO2 catalysts:: The reducibility of Mo(VI) species by thermal treatment in H2

Federica Prinetto, Giovanna Ghiotti

Journal:

Spectrochimica Acta Part A: Molecular and Biomolecular Spectroscopy

Year:

1999

Language:

english

File:

PDF, 311 KB

english, 1999

29

[IEEE 2014 IEEE 20th International On-Line Testing Symposium (IOLTS) - Platja d'Aro, Girona, Spain (2014.7.7-2014.7.9)] 2014 IEEE 20th International On-Line Testing Symposium (IOLTS) - A novel methodology to increase fault tolerance in autonomous FPGA-based systems

Di Carlo, Stefano, Gambardella, Giulio, Prinetto, Paolo, Rolfo, Daniele, Trotta, Pascal, Vallero, Alessandro

Year:

2014

Language:

english

File:

PDF, 256 KB

english, 2014

30

[IEEE Test Symposium (EWDTS) - St. Petersburg, Russia (2010.09.17-2010.09.20)] 2010 East-West Design & Test Symposium (EWDTS) - EDACs and test integration strategies for NAND flash memories

Di Carlo, Stefano, Fabiano, Michele, Piazza, Roberto, Prinetto, Paolo

Year:

2010

Language:

english

File:

PDF, 494 KB

english, 2010

31

[IEEE Comput. Soc. Press European Design and Test Conference EDAC-ETC-EUROASIC - Paris, France (28 Feb.-3 March 1994)] Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC - System-level modeling and verification: a comprehensive design methodology

Camurati, P., Corno, F., Prinetto, P., Bayol, C., Soulas, B.

Year:

1994

Language:

english

File:

PDF, 437 KB

english, 1994

32

[IEEE Comput. Soc. Press European Design and Test Conference. ED & TC 97 - Paris, France (17-20 March 1997)] Proceedings European Design and Test Conference. ED & TC 97 - A new approach to build a low-level malicious fault list starting from high-level description and alternative graphs

Benso, A., Prinetto, P., Rebaudengo, M., Sonza Reorda, M., Ubar, R.

Year:

1997

Language:

english

File:

PDF, 605 KB

english, 1997

33

[IEEE Comput. Soc Design, Automation and Test in Europe. Conference and Exhibition 2001 - Munich, Germany (13-16 March 2001)] Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001 - On applying the set covering model to reseeding

Chiusano, S., Di Carlo, S., Prinetto, P., Wunderlich, H.-J.

Year:

2001

Language:

english

File:

PDF, 488 KB

english, 2001

34

Industrial BIST of embedded RAMs

Camurati, P., Prinetto, P., Reorda, M.S., Barbagallo, S., Burri, A., Medina, D.

Journal:

IEEE Design & Test of Computers

Year:

1995

Language:

english

File:

PDF, 931 KB

english, 1995

35

[IEEE Comput. Soc. Press [1989] 1st European Test Conference - Paris, France (12-14 April 1989)] [1989] Proceedings of the 1st European Test Conference - Testability measures with concurrent good simulation

Cabodi, G.P., Camurati, P., Prinetto, P., Sonza Reorda, M.

Year:

1989

Language:

english

File:

PDF, 541 KB

english, 1989

36

FLARES

Carlo, Stefano Di, Galfano, Salvatore, Indaco, Marco, Prinetto, Paolo, Bertozzi, Davide, Olivo, Piero, Zambelli, Cristian

Journal:

ACM Transactions on Architecture and Code Optimization

Year:

2014

Language:

english

File:

PDF, 1.09 MB

english, 2014

37

EXFI: a low-cost fault injection system for embedded microprocessor-based boards

Benso, A., Prinetto, P., Rebaudengo, M., Reorda, M. Sonza

Journal:

ACM Transactions on Design Automation of Electronic Systems

Year:

1998

Language:

english

File:

PDF, 59 KB

english, 1998

38

[IEEE 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - Napoli, Italy (2015.4.21-2015.4.23)] 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - DTIS 2015 foreword

Prinetto, Paolo, Di Natale, Giorgio

Year:

2015

File:

PDF, 66 KB

2015

39

[IEEE 2014 9th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - Santorini, Greece (2014.5.6-2014.5.8)] 2014 9th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - DTIS 2014 foreword

Voyiatzis, Ioannis, Renovell, M., Masmoudi, M., Prinetto, Paolo, Di Natale, Giorgio

Year:

2014

File:

PDF, 55 KB

2014

40

[Frontiers in Electronic Testing] Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation Volume 23 || “Bond”: An Agents-Based Fault Injector for Windows NT

Benso, Alfredo, Prinetto, Paolo

Year:

2004

Language:

english

File:

PDF, 709 KB

english, 2004

41

A strategy for simulating bit-slice based microprogrammable systems

M. Mezzalama, P. Prinetto

Journal:

Microprocessing and Microprogramming

Year:

1981

Language:

english

File:

PDF, 744 KB

english, 1981

42

NOx adsorption study over Pt–Ba/alumina catalysts: FT-IR and pulse experiments

Isabella Nova, Lidia Castoldi, Luca Lietti, Enrico Tronconi, Pio Forzatti, Federica Prinetto, Giovanna Ghiotti

Journal:

Journal of Catalysis

Year:

2004

Language:

english

File:

PDF, 446 KB

english, 2004

43

Preparation and characterization of SnO2 and MoOx–SnO2 nanosized powders for thick film gas sensors

A Chiorino, G Ghiotti, F Prinetto, M.C Carotta, D Gnani, G Martinelli

Journal:

Sensors and Actuators B: Chemical

Year:

1999

Language:

english

File:

PDF, 1.95 MB

english, 1999

44

GATTO: a genetic algorithm for automatic test pattern generation for large synchronous sequential circuits

Corno, F., Prinetto, P., Rebaudengo, M., Sonza Reorda, M.

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

1996

Language:

english

File:

PDF, 1.04 MB

english, 1996

45

[IEEE Test Symposium (EWDTS) - Lviv, Ukraine (2008.10.9-2008.10.12)] Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) - An IEEE 1500 compatible wrapper architecture for testing cores at transaction level

Refan, Fatemeh, Prinetto, Paolo, Navabi, Zainalabedin

Year:

2008

Language:

english

File:

PDF, 349 KB

english, 2008

46

[IEEE Comput. Soc 9th International IEEE On-Line Testing Symposium - Kos Island, Greece (7-9 July 2003)] 9th IEEE On-Line Testing Symposium, 2003. IOLTS 2003. - A watchdog processor to detect data and control flow errors

Benso, A., Di Carlo, S., Di Natale, G., Prinetto, P.

Year:

2003

Language:

english

File:

PDF, 260 KB

english, 2003

47

[IEEE Tenth Asian Test Symposium - Kyoto, Japan (19-21 Nov. 2001)] Proceedings 10th Asian Test Symposium - Memory read faults: taxonomy and automatic test generation

Benso, A., Di Carlo, S., Di Natale, G., Prinetto, P.

Year:

2001

Language:

english

File:

PDF, 470 KB

english, 2001

48

[IEEE Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03 - Xi'an, China (2003.11.19-2003.11.19)] Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03 - Exhaustive test of several dependable memory architectures designed by GRAAL tool

Bertuccelli,, Bigongiari,, Brogna,, Di Natale,, Prinetto,, Saletti,

Year:

2003

Language:

english

File:

PDF, 489 KB

english, 2003

49

[IEEE 2002 International Test Conference - Baltimore, MD, USA (7-10 Oct. 2002)] Proceedings. International Test Conference - Static analysis of SEU effects on software applications

Benso, A., Di Carlo, S., Di Natale, G., Prinetto, P.

Year:

2002

Language:

english

File:

PDF, 495 KB

english, 2002

50

[IEEE Comput. Soc Meeting on Design Automation and Test in Europe - Paris, France (27-30 March 2000)] Proceedings Design, Automation and Test in Europe Conference and Exhibition 2000 (Cat. No. PR00537) - Optimal hardware pattern generation for functional BIST

Cataldo, S., Chiusano, S., Prinetto, P., Wunderlich, H.-J.

Year:

2000

Language:

english

File:

PDF, 48 KB

english, 2000

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